Accurate characterization of organic thin film transistors in the presence of gate leakage current

by Vinay K. Singh, Baquer Mazhari
Published 2011-12-01

Estimation of carrier mobility at organic semiconductor/insulator interface using an asymmetric capacitive test structure

by Rajesh Agarwal, Ashish K. Agarwal, Baquer Mazhari
Published 2016-04-01

Analysis of Kink Reduction in SOI MOSFET Using Selective Back Oxide Structure

by M. Narayanan, H. Al-Nashash, Baquer Mazhari, Dipankar Pal, Mahesh Chandra
Published 2012-01-01