Editorial: At source of nanotechnology

by Artur Zarzycki
Published 2014-01-01

Performance Characterization of an xy-Stage Applied to Micrometric Laser Direct Writing Lithography

by Juan Jaramillo, Artur Zarzycki, July Galeano, Patrick Sandoz
Published 2017-01-01

Fabrication of mems devices – a scanning micro mirror case study

by Artur Zarzycki, Wiktor L. Gambin, Sylwester Bargiel, Christophe Gorecki
Published 2017-05-01

An Optical Diffuse Reflectance Model for the Characterization of a Si Wafer with an Evaporated SiO₂ Layer

by Artur Zarzycki, July Galeano, Sylwester Bargiel, Aurore Andrieux, Christophe Gorecki
Published 2019-02-01

Microfabrication of position reference patterns onto glass microscope slides for high-accurate analysis of dynamic cellular events

by July A. Galeano, Patrick Sandoz, Artur Zarzycki, Laurent Robert, Juan M. Jaramillo
Published 2017-09-01

Visual in-plane positioning of a Labeled target with subpixel Resolution: basics and application

by Patrick Sandoz, July A. Galeano, Artur Zarzycki, Deivid Botina, Fabián Cortés-Mancera, Andrés Cardona, Laurent Robert
Published 2017-05-01

Estimation of Biological Parameters of Cutaneous Ulcers Caused by Leishmaniasis in an Animal Model Using Diffuse Reflectance Spectroscopy

by Deivid Botina, Ricardo Franco, Javier Murillo, July Galeano, Artur Zarzycki, Maria C. Torres-Madronero, Camilo Bermúdez, Jaime Montaño, Johnson Garzón, Franck Marzani, Sara M. Robledo
Published 2019-10-01