Design ICCreatech semiconductor wafer accounting and probe measurement automatization software

by Argunov Dmitry, Shiryaev Boris, Bezruk Alexey, Yushenko Alexey
Published 2019-01-01

Algorithm for automated visual inspection of MMIC using a classifier based on neural networks

by Shiryaev Boris, Bezruk Aleksey, Argunov Dmitry, Yushchenko Aleksey
Published 2019-01-01