Coupling effect in field Hall elements based on thin-film SOI MOS transistors

by Aleksey V. Leonov, Victor N. Murashev, Dmitry N. Ivanov, V.D. Kirilov
Published 2020-12-01

APPLICATION OF ELECTROOSMOTIC EFFECT FOR UNWATERING SAFETY BARRIERS DURING DECOMMISSIONING NUCLEAR LEGACY

by Mikhail V. Antonenko, Aleksey V. Leonov, Evgeny V. Bespala, Dmitry O. Chubreev, Yuliya R. Bespala
Published 2019-07-01