FEM Analysis of Sezawa Mode SAW Sensor for VOC Based on CMOS Compatible AlN/SiO2/Si Multilayer Structure

by Muhammad Zubair Aslam, Varun Jeoti, Saravanan Karuppanan, Aamir Farooq Malik, Asif Iqbal
Published 2018-05-01

A Review on Key Issues and Challenges in Devices Level MEMS Testing

by Muhammad Shoaib, Nor Hisham Hamid, Aamir Farooq Malik, Noohul Basheer Zain Ali, Mohammad Tariq Jan
Published 2016-01-01