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梁新聰
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梁新聰
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梁新聰
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1
A test generation system for sequential circuits
by
LIANG,XIN-CONG
,
梁
新
聰
Published 1991
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2
Testing and Improving Testability for Synchronous Sequential Circuits
by
Liang, Hsing-Chung
,
梁
新
聰
Published 1997
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3
Analysis Time improving of Fail Shape Analysis
by
JYH-MING JANG
,
章志名
Published 2005
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聰
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4
Test Generation for Transition Delay and RS-CFM Faults in Modified Booth Multipliers
by
Pao-Hsin Huang
,
黃柏馨
Published 2007
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