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朱又麟
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朱又麟
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朱又麟
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1
A New Charge-Pumping Technique and Its Application to Reliability Analysis of Band-to-Band Tunneling-Induced Hot-Carrier Stress
by
Yu-Lin Chu
,
朱
又
麟
Published 2000
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2
The characteristics of PMOSFET devices under AC pulse operations
by
Yu-Lin Chu
,
朱
又
麟
Published 1993
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