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124“... on the Texas Instruments (TI) TMS320C6416 digital signal processor (DSP). After a brief review...”
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126“...碩士 === 國立中山大學 === 財務管理學系研究所 === 96 === S. David Young and F. O’Byren (2000) divided the economic...”
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128by James C. Stegen, James K. Fredrickson, Michael J. Wilkins, Allan E. Konopka, William C. Nelson, Evan V. Arntzen, William B. Chrisler, Rosalie K. Chu, Robert E. Danczak, Sarah J. Fansler, David W. Kennedy, Charles T. Resch, Malak TfailyGet full text
Published 2016-04-01
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129by Ana Lopez-Campistrous, Esther Ekpe Adewuyi, Matthew G.K. Benesch, Yi Man Ko, Raymond Lai, Aducio Thiesen, Jay Dewald, Peng Wang, Karen Chu, Sunita Ghosh, David C. Williams, Larissa J. Vos, David N. Brindley, Todd P.W. McMullenGet full text
Published 2016-10-01
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130by Matthew E. Reiter, Eduardo Palacios, Diana Eusse-Gonzalez, Richard Johnston González, Pete Davidson, David W. Bradley, Rob Clay, Khara M. Strum, James Chu, Blake A. Barbaree, Catherine M. Hickey, David B. Lank, Mark Drever, Ronald C. Ydenberg, Robert ButlerGet full text
Published 2020-12-01
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131by Xavier Vila-Farres, John Chu, Melinda A. Ternei, Christophe Lemetre, Steven Park, David S. Perlin, Sean F. Brady, Patricia A. Bradford
Published 2018-01-01Article -
132by GenaLynne C. Mooneyham, Vladimir Ferrafiat, Vladimir Ferrafiat, Erin Stolte, D. Catherine Fuchs, D. Catherine Fuchs, David Cohen, David CohenGet full text
Published 2021-03-01
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134by Yibo Du, Yanjun Zhou, Kexing Song, Tao Huang, David Hui, Haitao Liu, Chu Cheng, Jingzhao Yang, Liye Niu, Huiwen GuoGet full text
Published 2021-09-01
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135by Xu Xingyuan, Tan Mengxi, Wu Jiayang, Chu Sai T., Little Brent E., Morandotti Roberto, Nguyen Thach, Mitchell Arnan, Moss David J.Get full text
Published 2020-01-01
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138by Cruz Chu, David Ricardo, Quea Vásquez, Juan Antonio, Bacilio Bernal, Luis Alberto, Lizárraga Rossell, Mary Carmen, Guerra Parra, Oscar Alberto“... origen, (c) mantener el control estadístico de procesos para medir la variabilidad en la fabricación, (d...”
Published 2018
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139by Cruz Chu, David Ricardo, Quea Vásquez, Juan Antonio, Bacilio Bernal, Luis Alberto, Lizárraga Rossell, Mary Carmen, Guerra Parra, Oscar Alberto“... origen, (c) mantener el control estadístico de procesos para medir la variabilidad en la fabricación, (d...”
Published 2018
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140by Gabriel Helmlinger, Victor Sokolov, Kirill Peskov, Karen M. Hallow, Yuri Kosinsky, Veronika Voronova, Lulu Chu, Tatiana Yakovleva, Ivan Azarov, Daniel Kaschek, Artem Dolgun, Henning Schmidt, David W. Boulton, Robert C. PenlandGet full text
Published 2019-06-01
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