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Silicon substrates
Substrates
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Silicon
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Scanning electron microscopy
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Catalysts
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Si-Ge alloys
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Thin films
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Chemical vapor deposition
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Field emission microscopes
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Field emission scanning electron microscopy
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Germanium
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III-V semiconductors
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Lattice mismatch
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Nanorods
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Phases transformation
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Semiconductor materials
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Silicon wafers
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Tin alloys
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X ray diffraction
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1550 nm
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2-Methoxyethanol
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Ammonium hydroxide
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Annealing temperatures
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12by Baryshnikova, M., Colucci, D., De Koninck, Y., Kunert, B., Langer, R., Mols, Y., Muneeb, M., Pantouvaki, M., Shi, Y., Van Campenhout, J., Van Thourhout, D., Yudistira, D.View Fulltext in Publisher
Published 2022
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