Depth Estimation 1 Domain adaptation 1 Fine tuning 1 Machine learning 1 Mean relative error 1 Monocular depth estimation 1 Network architecture 1 Optical critical dimension Optical critical dimensions 1 Pixels 1 SEM image 1 SEM images 1 Scanning electron microscopy 1 Scatterometry 1 Semiconductor device manufacture 1 Training procedures 1 Tuning 1 Weakly supervised learning 1