FinFET 1/F noise 1 1/f-noise 1 Circuit performance 1 Circuit reliability 1 Delay circuits 1 Drain current 1 Drain-to-source voltages 1 Electric network analysis 1 Electrical parameter 1 Fin field-effect transistors 1 Flip flop circuits 1 Gallium compounds 1 High-performance circuits 1 Integrated circuit manufacture 1 Leakage currents 1 Low-leakage current 1 Negative bias temperature instability 1 Negative bias temperature instability (NBTI) 1 Negative stress 1 On-off ratio 1 Performance 1 Si substrates 1 Simulation configuration 1 Stress condition 1 Sub-threshold swing(ss) 1 Thermodynamic stability 1 β -Ga2O3 1