| Summary: | Nanocomposite poly (methyl methacrylate) : titanium dioxide (PMMA :TiO2) film were deposited on glass substrate. The effect of annealing temperature, especially on electrical, dielectric and the morphological properties of the thin films were investigated by current-voltage (I-V) measurement, impedance spectroscopy, and FESEM. The annealing temperature is varies from 120 degrees C, 140 degrees C, 160 degrees C, 180 degrees C and 200 degrees C. The electrical properties results showing when nanocomposite film annealed at 120 degrees C produce the lowest current. Meanwhile, when the annealing temperature increased, the current increased drastically and this indicates the PMMA:TiO2 nanocomposite film are no longer having insulating properties. The dielectric properties also indicate that film annealed at 120 degrees C has the best dielectric properties compared to other temperature. The FESEM results show that as the temperature increased, the PMMA:TiO2 nanocomposite film started to create a phase separation between the PMMA matrix and TiO2 nanoparticles.
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