High resolution x-ray characterization of periodically domain-inverted nonlinear optical crystals
A high-resolution triple-axis diffractometer has been used for the structural characterization of periodically domain-inverted nonlinear optical crystals of KTiOPO<sub>4</sub> and LNbO<sub>3</sub>. Striations have been revealed in high strain-sensitivity multiple-crystal topo...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
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1995-04-14.
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| Online Access: | Get fulltext |
| LEADER | 01273 am a22001453u 4500 | ||
|---|---|---|---|
| 001 | 78171 | ||
| 042 | |a dc | ||
| 100 | 1 | 0 | |a Hu, Z.W. |e author |
| 700 | 1 | 0 | |a Thomas, P.A. |e author |
| 700 | 1 | 0 | |a Webjörn, J. |e author |
| 245 | 0 | 0 | |a High resolution x-ray characterization of periodically domain-inverted nonlinear optical crystals |
| 260 | |c 1995-04-14. | ||
| 856 | |z Get fulltext |u https://eprints.soton.ac.uk/78171/1/929.pdf | ||
| 520 | |a A high-resolution triple-axis diffractometer has been used for the structural characterization of periodically domain-inverted nonlinear optical crystals of KTiOPO<sub>4</sub> and LNbO<sub>3</sub>. Striations have been revealed in high strain-sensitivity multiple-crystal topographs of the domain-inverted regions of both these samples and these are dominated by orientation contrast. The combination of high-resolution reciprocal-space mapping and topography has shown that the extended diffraction streak in the q[210] direction for domain-inverted LiNbO<sub>3</sub> originates from the "minutely misoriented structure" which is related to the original configuration of dislocations. The reason for the generation of the structural imperfections via the domain-inversion processing is interpreted in terms of the converse piezoelectric effect. | ||
| 655 | 7 | |a Article | |