Preparation and properties of Mg(B<sub>1-x</sub>C<sub>x</sub>)<sub>2</sub> using Carbon Chemical Vapor Coated Boron

Promising initial results on bulk Mg(B1-xCx)2 prepared with carbon doped boron are presented. Carbon doping is achieved by reaction of ethylene gas on boron powder using a stainless steel tube furnace, a technique suitable for industrial scale processing. The nominal amount of doping was controlled...

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Bibliographic Details
Main Authors: Young, E.A (Author), Yang, Y. (Author)
Format: Article
Language:English
Published: 2007-06.
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Online Access:Get fulltext
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100 1 0 |a Young, E.A.  |e author 
700 1 0 |a Yang, Y.  |e author 
245 0 0 |a Preparation and properties of Mg(B<sub>1-x</sub>C<sub>x</sub>)<sub>2</sub> using Carbon Chemical Vapor Coated Boron 
260 |c 2007-06. 
856 |z Get fulltext  |u https://eprints.soton.ac.uk/66435/1/YoungPaperMgB2-C.pdf 
520 |a Promising initial results on bulk Mg(B1-xCx)2 prepared with carbon doped boron are presented. Carbon doping is achieved by reaction of ethylene gas on boron powder using a stainless steel tube furnace, a technique suitable for industrial scale processing. The nominal amount of doping was controlled by varying the reaction time with a fixed volume of ethylene gas, and the actual carbon uptake was determined by weight change after the reaction.The amount of carbon substitution x in the Mg(B-xCx)2 was found using the angular shift in the (100) x-ray reflection. Carbon substitution by the full nominal content in the C doped precursor boron was obtained for doping up to 7.2at%, as shown by a -axis compression consistent with that of carbon doped single crystals. The critical current density of the 4 at% C doped sample for temperatures at 20-30 K and fields up to 4 T, relevant to high temperature applications, was significantly higher than those in the published literature. The C of a 10wt% nano-SiC doped sample, used as a comparative benchmark, was found to be lower than the C doped sample at field below 2 T, but to reduce slower at higher fields. Structure analysis of the SiC doped sample revealed a coexistence of two C substitution levels of 2.25%at and 5.25%at. 
655 7 |a Article