Latch susceptibility to transient faults and new hardening approach
In this paper, we analyze the conditions making transient faults (TFs) affecting the nodes of conventional latch structures generate output soft errors (SEs). We investigate the susceptibility to TFs of all latch nodes and identify the most critical one(s). We show that, for standard latches using b...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
2007-09.
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| Subjects: | |
| Online Access: | Get fulltext |