Validation of finite element structural simulation for ohmic microcontact
In the current literature, there is no model able to accurately predict the electrical resistance value of rough micro- contacts. Such model requires a coupled thermo-electro-structural analysis that is very difficult to validate in a straightforward manner. In the present approach, atomic force mic...
Main Authors: | Liu, Hong (Author), Leray, Dimitri (Author), Pons, Patrick (Author), Broue, Adrien (Author), Martegoutte, Julien (Author) |
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Format: | Article |
Language: | English |
Published: |
2011-09.
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Subjects: | |
Online Access: | Get fulltext |
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