A Fast and Accurate Process Variation-aware Modeling Technique for Resistive Bridge Defects
Recent research has shown that tests generated without taking process variation into account may lead to loss of test quality. At present there is no efficient device-level modeling technique that models the effect of process variation on resistive bridge defects. This paper presents a fast and accu...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
2011-07-05.
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| Subjects: | |
| Online Access: | Get fulltext |