Scaling Analysis of Nanoelectromechanical Memory Devices

Scaling Analysis of Nanoelectromechanical Memory Devices

Bibliographic Details
Main Authors:	Nagami, T (Author), Tsuchiya, Yoshishige (Author), Uchida, K (Author), Mizuta, Hiroshi (Author), Oda, S (Author)
Format:	Article
Language:	English
Published:	2010.
Subjects:	Article
Online Access:	Get fulltext

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