Efficient test compaction for combinational circuits based on Fault detection count-directed clustering
Test compaction is an effective technique for reducing test data volume and test application time. The authors present a new static test compaction technique based on test vector decomposition and clustering. Test vectors are decomposed and clustered for faults in an increasing order of faults detec...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
2007-07.
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| Subjects: | |
| Online Access: | Get fulltext |
