Efficient Static Compaction Techniques for Sequential Circuits Based on Reverse-Order Restoration and Test Relaxation
The paper present efficient reverse-order-restoration (ROR)-based static test compaction techniques for synchronous sequential circuits. Unlike previous ROR techniques that rely on vector-by-vector fault-simulation-based restoration of test subsequences, the authors' technique restores test seq...
Main Authors: | El-Maleh, Aiman (Author), Khursheed, Syed Saqib (Author), M. Sait, Sadiq (Author) |
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Format: | Article |
Language: | English |
Published: |
2006-11.
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Subjects: | |
Online Access: | Get fulltext |
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