Efficient Static Compaction Techniques for Sequential Circuits Based on Reverse-Order Restoration and Test Relaxation

The paper present efficient reverse-order-restoration (ROR)-based static test compaction techniques for synchronous sequential circuits. Unlike previous ROR techniques that rely on vector-by-vector fault-simulation-based restoration of test subsequences, the authors' technique restores test seq...

Full description

Bibliographic Details
Main Authors: El-Maleh, Aiman (Author), Khursheed, Syed Saqib (Author), M. Sait, Sadiq (Author)
Format: Article
Language:English
Published: 2006-11.
Subjects:
Online Access:Get fulltext

Similar Items