Efficient Static Compaction Techniques for Sequential Circuits Based on Reverse-Order Restoration and Test Relaxation
The paper present efficient reverse-order-restoration (ROR)-based static test compaction techniques for synchronous sequential circuits. Unlike previous ROR techniques that rely on vector-by-vector fault-simulation-based restoration of test subsequences, the authors' technique restores test seq...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
2006-11.
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| Subjects: | |
| Online Access: | Get fulltext |