Simulation study of the dependence of submicron polysilicon thin film transistor output characteristics on grain boundary position

Simulation study of the dependence of submicron polysilicon thin film transistor output characteristics on grain boundary position

Bibliographic Details
Main Authors:	Walker, P. (Author), Uno, S. (Author), Mizuta, Hiroshi (Author)
Format:	Article
Language:	English
Published:	2005.
Subjects:	Article
Online Access:	Get fulltext

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