Impact of ex-situ and in-situ cleans on the performance of bipolar transistors with low thermal budget in-situ phosphorus doped polysilicon emitter contacts

This paper investigates the effects of an in-situ hydrogen bake and an ex-situ HF etch prior to polysilicon deposition on the electrical characteristics of bipolar transistors fabricated with low thermal budget in-situ phosphorus doped polysilicon emitter contacts. Emitter contact deposition in an U...

Full description

Bibliographic Details
Main Authors: Rahim, A I A (Author), Marsh, C D (Author), Ashburn, P (Author), Booker, G R (Author)
Format: Article
Language:English
Published: 2001-11.
Subjects:
Online Access:Get fulltext