A simple approach of determination of the crystallographic orientation: Applications and accuracy
A simple analytical solution for the crystallographic orientation is described. This method is based on one indexed Kikuchi pair in a known zone rather than the corresponding diffraction spots. The accuracy of this method is shown to be better than 0.1° even for cases in which a zone axis deviates b...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
2003.
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| Subjects: | |
| Online Access: | Get fulltext |
| Summary: | A simple analytical solution for the crystallographic orientation is described. This method is based on one indexed Kikuchi pair in a known zone rather than the corresponding diffraction spots. The accuracy of this method is shown to be better than 0.1° even for cases in which a zone axis deviates by a large angle (e.g. 10°) from the centre of the beam direction. This approach simplifies experiments beacuse only one pair of Kikuchi lines and a zone axis are needed, and is especially suited when it is difficult or cumbersome to resolve a second pair of Kikuchi lines with sufficient accuracy. |
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