On the growth and lasing characteristics of thick Nd:GGG waveguiding films fabricated by pulsed laser deposition

Pulsed laser deposition of epitaxial, single-crystal Nd:Gd<sub>3</sub>Ga<sub>5</sub>O<sub>12</sub> (Nd:GGG) films on Y<sub>3</sub>Al<sub>5</sub>O<sub>12</sub> substrates with thicknesses up to 135 µm and propagation losses as lo...

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Bibliographic Details
Main Authors: Grivas, C. (Author), May-Smith, Timothy (Author), Shepherd, David (Author), Eason, R.W (Author)
Format: Article
Language:English
Published: 2004.
Subjects:
Online Access:Get fulltext
LEADER 01368 am a22001573u 4500
001 13942
042 |a dc 
100 1 0 |a Grivas, C.  |e author 
700 1 0 |a May-Smith, Timothy  |e author 
700 1 0 |a Shepherd, David  |e author 
700 1 0 |a Eason, R.W.  |e author 
245 0 0 |a On the growth and lasing characteristics of thick Nd:GGG waveguiding films fabricated by pulsed laser deposition 
260 |c 2004. 
856 |z Get fulltext  |u https://eprints.soton.ac.uk/13942/1/2701.pdf 
520 |a Pulsed laser deposition of epitaxial, single-crystal Nd:Gd<sub>3</sub>Ga<sub>5</sub>O<sub>12</sub> (Nd:GGG) films on Y<sub>3</sub>Al<sub>5</sub>O<sub>12</sub> substrates with thicknesses up to 135 µm and propagation losses as low as 0.1 dB/cm is reported. Rutherford backscattering spectrometry has shown constant stoichiometry for the films throughout their depth. Fluorescence properties were similar to that of the bulk Nd:GGG crystal used as a target material for the deposition and lasing action has been observed at 1059.0 and 1060.6 nm after pumping by a Ti:sapphire laser operating at 808 nm. A laser threshold of 18 mW has been obtained and a slope efficiency of 17.5% has been observed using an output coupler of 4.5%. The low losses in combination with the high numerical aperture (0.75) and the thickness of the structures make them suitable for high-power diode pumping. 
655 7 |a Article