Thermally poled silica samples are structurally heterogeneous: Electron diffraction evidence of partial crystallization

Thermally poled silica samples are structurally heterogeneous: Electron diffraction evidence of partial crystallization

Large structural modifications in v-SiO<sub>2</sub> are found to be induced by "thermal poling," a treatment which makes the glass act as a frequency doubler of an impinging infrared light. The electron diffraction patterns of poled silica plates reveal the presence of a large...

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Bibliographic Details
Main Authors: Cabrillo, C. (Author), Bermejo, F.J (Author), Gibson, J.M (Author), Johnson, J.A (Author), Faccio, D. (Author), Pruneri, V. (Author), Kazansky, P.G (Author)
Format: Article
Language:English
Published: 2001.
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Summary:Large structural modifications in v-SiO<sub>2</sub> are found to be induced by "thermal poling," a treatment which makes the glass act as a frequency doubler of an impinging infrared light. The electron diffraction patterns of poled silica plates reveal the presence of a large amount (of order 10%) of crystallites showing patterns consistent with partial crystallization of the glassy matrix into the cristobalite polymorph of silica.

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