Research on Analog-to-Digital Converter (ADC) Dynamic Parameter Method Based on the Sinusoidal Test Signal

Research on Analog-to-Digital Converter (ADC) Dynamic Parameter Method Based on the Sinusoidal Test Signal

The acquisition of dynamic analog-to-digital converter (ADC) parameters is becoming increasingly relevant as electronic information develops at a rapid pace. The fundamental challenge of the spectrum test for ADC is that coherent sampling is difficult to achieve, especially because of the high accur...

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Bibliographic Details
Main Authors: Cui, W. (Author), Hu, C. (Author), Jiang, J. (Author), Li, J. (Author), Peng, X. (Author), Sun, N. (Author), Wang, S. (Author), Zhang, D. (Author), Zhang, Z. (Author)
Format: Article
Language:English
Published: MDPI 2022
Subjects:
ADC test
DFT
EEMD
Hilbert transform
incoherent sampling
spectrum test
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