Complex-Amplitude-Modulation Vectorial Excitation Beam for High-Resolution Observation of Deep Regions in Two-Photon Microscopy
In two-photon microscopy, aberration correction is an essential technique for realizing high resolution in deep regions. A spatial light modulator (SLM) incorporated into an optical system for two-photon microscopy performs pre-compensation on the wavefront of the excitation beam, restoring the reso...
Main Authors: | Inoue, T. (Author), Konno, A. (Author), Matsumoto, N. (Author), Okazaki, S. (Author), Watanabe, K. (Author) |
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Format: | Article |
Language: | English |
Published: |
Frontiers Media S.A.
2022
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Subjects: | |
Online Access: | View Fulltext in Publisher |
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