aPIE: an angle calibration algorithm for reflection ptychography
Reflection ptychography is a lensfree microscopy technique particularly promising in regions of the electromagnetic spectrum where imaging optics are inefficient or not available. This is the case in tabletop extreme ultraviolet microscopy and grazing incidence small angle x ray scattering experimen...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Optica Publishing Group (formerly OSA)
2022
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| Subjects: | |
| Online Access: | View Fulltext in Publisher |