Near-field mapping of high permittivity dielectric microwave resonator modes via optically induced conductance

Near-field mapping of high permittivity dielectric microwave resonator modes via optically induced conductance

In this paper, we demonstrate a straightforward, low-cost, and high resolution opticalbased method to measure the three-dimensional relative electric field magnitude in microwave circuits without the need to monitor reflected laser beams or the requirement of photoconductive substrates for the devic...

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Bibliographic Details
Main Authors: Allen, J.W (Author), Allen, M.S (Author), Anthony, N.M (Author), Dev, S.U (Author), Trendafilov, S. (Author)
Format: Article
Language:English
Published: Optica Publishing Group (formerly OSA) 2022
Subjects:
Dielectric devices
Dielectric microwave resonators
Electric field magnitude
Electric fields
Electron hole pairs
High permittivity dielectric
High resolution
Laser beams
Low-costs
Low-high
Microwave circuits
Microwave resonators
Microwaves
Near-field mappings
Optically induced
Permittivity
Resonator mode
Substrates
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