Measurement of arbitrary scan patterns for correction of imaging distortions in laser scanning microscopy
Laser scanning microscopy requires beam steering through relay and focusing optics at sub-micron precision. In light-weight mobile systems, such as head mounted multiphoton microscopes, distortion and imaging plane curvature management is unpractical due to the complexity of required optic compensat...
| Main Authors: | , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Optica Publishing Group (formerly OSA)
2022
|
| Subjects: | |
| Online Access: | View Fulltext in Publisher |