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01978nam a2200385Ia 4500 |
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10.1063-5.0086321 |
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|a 00218979 (ISSN)
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|a High gradient silicon carbide immersion lens ultrafast electron sources
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|b American Institute of Physics Inc.
|c 2022
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|z View Fulltext in Publisher
|u https://doi.org/10.1063/5.0086321
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|a We present two compact ultrafast electron injector designs with integrated focusing that provide high peak brightness of up to 1.9 × 1012 A/m2 Sr2 with 10's of electrons per laser pulse using silicon carbide electrodes and silicon nanotip emitters. We demonstrate a few centimeter scale 96 keV immersion lens electron source and a 57 keV immersion lens electron source with a 19 kV/mm average acceleration gradient, nearly double the typical 10 kV/mm used in DC electron sources. The brightness of the electron sources is measured alongside start-to-end simulations including space charge effects. These sources are suitable for dielectric laser accelerator experiments, ultrafast electron diffraction, and other applications, where a compact high brightness electron source is required. © 2022 Author(s).
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|a Centimeter-scale
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|a Electron injectors
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|a Electron sources
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|a Electrons
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|a High brightness
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|a High gradient
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|a Immersion lens
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|a Laser accelerators
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|a Luminance
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|a Silicon carbide
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|a Silicon nanotips
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|a Space charge effects
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|a Ultra-fast
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|a Ultrafast electron diffraction
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|a Broaddus, P.
|e author
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|a Byer, R.L.
|e author
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|a Leedle, K.J.
|e author
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|a Miao, Y.
|e author
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|a Niedermayer, U.
|e author
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|a Skär, E.
|e author
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|a Solgaard, O.
|e author
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|a Urbanek, K.
|e author
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|t Journal of Applied Physics
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