Long-wave infrared super-resolution wide-field microscopy using sum-frequency generation

Super-resolution microscopy in the visible is an established powerful tool in various disciplines. In the long-wave infrared (LWIR) spectral range, however, no comparable schemes have been demonstrated to date. In this work, we experimentally demonstrate super-resolution microscopy in the LWIR range...

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Bibliographic Details
Main Authors: Caldwell, J.D (Author), De Pas, M. (Author), Gewinner, S. (Author), Lu, G. (Author), Niemann, R. (Author), Paarmann, A. (Author), Schöllkopf, W. (Author), Wasserroth, S. (Author), Wolf, M. (Author)
Format: Article
Language:English
Published: American Institute of Physics Inc. 2022
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Summary:Super-resolution microscopy in the visible is an established powerful tool in various disciplines. In the long-wave infrared (LWIR) spectral range, however, no comparable schemes have been demonstrated to date. In this work, we experimentally demonstrate super-resolution microscopy in the LWIR range (λ I R ≈ 10 - 12 μm) using IR-visible sum-frequency generation. We operate our microscope in a wide-field scheme and image localized surface phonon polaritons in 4H-SiC nanostructures as a proof-of-concept. With this technique, we demonstrate an enhanced spatial resolution of ∼ λ I R / 9, enabling to resolve the polariton resonances in individual sub-diffractional nanostructures with sub-wavelength spacing. Furthermore, we show that this resolution allows us to differentiate between spatial patterns associated with different polariton modes within individual nanostructures. © 2022 Author(s).
ISBN:00036951 (ISSN)
DOI:10.1063/5.0081817