Investigation of Measurement Artifacts Introduced By Horizontal Scanning Surface Profiling Instruments
Horizontal scanning instruments, such as, atomic force microscopes and scanning laser microscopes, acquire three-dimensional topographic maps of surfaces, at scales ranging from tenths of nanometers to hundreds of millimeters, by measuring elevations along a series of traces scanning a region of the...
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Digital WPI
2002
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| Online Access: | https://digitalcommons.wpi.edu/etd-theses/29 https://digitalcommons.wpi.edu/cgi/viewcontent.cgi?article=1028&context=etd-theses |