A Study on the Nature of Anomalous Current Conduction in Gallium Nitride
Current leakage in GaN thin films limits reliable device fabrication. A variety of Ga and N rich MBE GaN thin films grown by Rf, NH3, and Rf+ NH3, are examined with electrical measurements on NiIAu Schottky diodes and CAFM. Current-voltage (IV) mechanisms will identify conduction mechanisms on diode...
| Main Author: | |
|---|---|
| Format: | Others |
| Published: |
VCU Scholars Compass
2005
|
| Subjects: | |
| Online Access: | http://scholarscompass.vcu.edu/etd/709 http://scholarscompass.vcu.edu/cgi/viewcontent.cgi?article=1708&context=etd |