Modified Geffe test pattern generator for built-in self-test
Unlike linear Finite State Machines (FSM) such as Linear Feedback Shift Registers (LFSR), the Geffe generator, a nonlinear FSM, hasn't been frequently studied or used in the scenario of digital system testing. Such machines are used as pattern generators for built-in self-test. LFSRs have becom...
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| Language: | English en |
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2010
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| Online Access: | http://hdl.handle.net/1828/2210 |