Measurement of Refractive Index and Thickness of Multi Layer Systems Using Fourier Domain Optical Coherence Tomography
A multilayered system is a good model for many optical systems. An optical coherence tomography (OCT) system can provide fundamental information about the refractive index distribution of the sample and enables images to be corrected for geometric accuracy, but this requires the separation of...
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| Language: | en |
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Université d'Ottawa / University of Ottawa
2016
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| Online Access: | http://hdl.handle.net/10393/34792 http://dx.doi.org/10.20381/ruor-6066 |
| Summary: | A multilayered system is a good model for many optical systems. An optical
coherence tomography (OCT) system can provide fundamental information about
the refractive index distribution of the sample and enables images to be corrected
for geometric accuracy, but this requires the separation of refractive index and
physical thickness for each layer from the measured optical paths. In this thesis a
novel approach for simultaneous extraction of index and thickness of multi layer
systems and the last medium index of refraction in a single experiment using only
the object’s spectral response available by any Fourier Domain OCT system without
using any additional outside measurements is introduced. The method is based on a
novel matrix equation that uses the reflected spectrum from the object and the
measured optical thickness. In the presence of slight error of measuring optical
thickness, the parameters extraction has wavenumber dependency. A novel method
is used to select the suitable set of spectral components that reduces the extracted
parameters error. The parameters extraction method is followed by a fitting process
for optimized results. The method works the best for low contrast index distribution
even in the presence of relatively large optical thickness measurement error. |
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