Test suite reduction using SDL and EFSM dependency analysis

• Main Author: Ritthiruangdech, Panitee
• Format: Others
• Language: en
• Published: University of Ottawa (Canada) 2013
• Subjects: Computer Science.
• Online Access: http://hdl.handle.net/10393/26758; http://dx.doi.org/10.20381/ruor-18354

A reduction of a requirement-based test suite can be achieved without significantly reducing the fault-detection capabilities of the original test suite. This is done by eliminating all but one of the equivalent test cases from each class of equivalent test cases of the original test suite. A requirement-based reduction technique proposed in [1] uses EFSM dependency analysis to define classes of equivalent test cases. Two types of dependencies, namely control and data dependencies, are identified in an EFSM/SDL model. In this thesis, based on [1], we have proposed algorithms to generate interaction patterns of a test case w.r.t. a requirement under test, algorithms to compare interaction patterns and determine whether or not they are equivalent, and an algorithm to identify a set of interaction patterns (w.r.t. the requirement under test) that are not covered by any test case from a given test suite. Also, Test Suite Reduction (TSR) program has been developed based on these algorithms, which contributes towards object oriented testing. (Abstract shortened by UMI.)