Charge Collection Studies on Integrated Circuit Test Structures using Heavy-Ion Microbeams and MEDICI Simulation Calculations
Ion induced charge collection dynamics within Integrated Circuits (ICs) is important due to the presence of ionizing radiation in the IC environment. As the charge signals defining data states are reduced by voltage and area scaling, the semiconductor device will naturally have a higher susceptibili...
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| Format: | Others |
| Language: | English |
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University of North Texas
2000
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| Online Access: | https://digital.library.unt.edu/ark:/67531/metadc2469/ |