SUPER RESOLUTION 3D SCANNING USING SPATIAL LIGHT MODULATOR AND BAND CORRECTION

Multi Frequency Phase Measuring Profilometry is the most popular lateral contact 3-D Scanning technique. The Phase Measuring Profilometry is limited in resolution by the projector and cameras used. Conventional signal projectors have a maximum of 2000 to 4000 scan lines limiting the projector resolu...

Full description

Bibliographic Details
Main Author: Pethe, Akshay
Format: Others
Published: UKnowledge 2008
Subjects:
Online Access:http://uknowledge.uky.edu/gradschool_theses/550
http://uknowledge.uky.edu/cgi/viewcontent.cgi?article=1554&context=gradschool_theses

Similar Items