Contribution de la Spectrométrie de Masse d’Ions Secondaires à Temps de Vol au développement de textiles industriels fonctionnels impliquant des agents actifs cosmétiques

Contribution de la Spectrométrie de Masse d’Ions Secondaires à Temps de Vol au développement de textiles industriels fonctionnels impliquant des agents actifs cosmétiques

La Spectrométrie de Masse d'Ions Secondaires à Temps de Vol (ToF-SIMS) permet la caractérisation de l'extrême surface à haute sensibilité via la détection d'ions secondaires atomiques et moléculaires. Ces travaux ont visé à étudier son application pour l'analyse de textiles indus...

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Bibliographic Details
Main Author:	Desbrosses, Mickaël
Other Authors:	Lyon
Language:	fr
Published:	2016
Subjects:	ToF-SIMS Analyse de surface Calibration Décapage Agents actifs cosmétiques Textiles techniques Polymères Surface analysis Gentle sputtering Cosmetic active agents Technical textiles Polymers 541.33
Online Access:	http://www.theses.fr/2016LYSE1117

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