Statistical Performance Modeling of SRAMs
Yield analysis is a critical step in memory designs considering a variety of performance constraints. Traditional circuit level Monte-Carlo simulations for yield estimation of Static Random Access Memory (SRAM) cell is quite time consuming due to their characteristic of low failure rate, while stati...
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| Format: | Others |
| Language: | en_US |
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2011
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| Online Access: | http://hdl.handle.net/1969.1/ETD-TAMU-2009-12-7539 |