Bayesian Hierarchical Model for Combining Two-resolution Metrology Data
This dissertation presents a Bayesian hierarchical model to combine two-resolution metrology data for inspecting the geometric quality of manufactured parts. The high- resolution data points are scarce, and thus scatter over the surface being measured, while the low-resolution data are pervasive, bu...
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| Format: | Others |
| Language: | en_US |
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2010
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| Online Access: | http://hdl.handle.net/1969.1/ETD-TAMU-2008-12-164 http://hdl.handle.net/1969.1/ETD-TAMU-2008-12-164 |