Variance reduction and outlier identification for IDDQ testing of integrated chips using principal component analysis
Integrated circuits manufactured in current technology consist of millions of transistors with dimensions shrinking into the nanometer range. These small transistors have quiescent (leakage) currents that are increasingly sensitive to process variations, which have increased the variation in good-ch...
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
Texas A&M University
2007
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/1969.1/4766 |