Direct measurements of ensemble particle and surface interactions on homogeneous and patterned substrates

In this dissertation, we describe a novel method that we call Diffusing Colloidal Probe Microscopy (DCPM), which integrates Total Internal Reflection Microscopy (TIRM) and Video Microscopy (VM) methods to monitor three dimensional trajectories in colloidal ensembles levitated above macroscopic surfa...

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Main Author: Wu, Hung-Jen
Other Authors: Bevan, Michael A.
Format: Others
Language:en_US
Published: Texas A&M University 2006
Subjects:
Online Access:http://hdl.handle.net/1969.1/3747
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spelling ndltd-tamu.edu-oai-repository.tamu.edu-1969.1-37472013-01-08T10:38:13ZDirect measurements of ensemble particle and surface interactions on homogeneous and patterned substratesWu, Hung-JenTotal internal reflection microscopydiffusing colloidal probes microscopyTIRMsurface potentialpatterncolloidal forceensemble analysismap potential energy landscapeOrnstein-Zernike analysisIn this dissertation, we describe a novel method that we call Diffusing Colloidal Probe Microscopy (DCPM), which integrates Total Internal Reflection Microscopy (TIRM) and Video Microscopy (VM) methods to monitor three dimensional trajectories in colloidal ensembles levitated above macroscopic surfaces. TIRM and VM are well established optical microscopy techniques for measuring normal and lateral colloidal excursions near macroscopic planar surfaces. The interactions between particle-particle and particle-substrate in colloidal interfacial systems are interpreted by statistical analyses from distributions of colloidal particles; dynamic properties of colloidal assembly are also determined from particle trajectories. Our studies show that DCPM is able to detect many particle-surface interactions simultaneously and provides an ensemble average measurement of particle-surface interactions on a homogeneous surface to allow direct comparison of distributed and average properties. A benefit of ensemble averaging of many particles is the diminished need for time averaging, which can produce orders of magnitude faster measurement times at higher interfacial particle concentrations. The statistical analyses (Ornstein- Zernike and three dimensional Monte Carlo analyses) are used to obtain particle-particle interactions from lateral distribution functions and to understand the role of nonuniformities in interfacial colloidal systems. An inconsistent finding is the observation of an anomalous long range particle-particle attraction and recovery of the expected DLVO particle-wall interactions for all concentrations examined. The possible influence of charge heterogeneity and particle size polydispersity on measured distribution functions is discussed in regard to inconsistent particle-wall and particle-particle potentials. In the final part of this research, the ability of DCPM is demonstrated to map potential energy landscapes on patterned surfaces by monitoring interactions between diffusing colloidal probes with Au pattern features. Absolute separation is obtained from theoretical fits to measured potential energy profiles and direct measurement by sticking silica colloids to Au surfaces via electrophoretic deposition. Initial results indicate that, as colloidal probe and pattern feature dimensions become comparable, measured potential energy profiles suffer some distortion due to the increased probability of probes interacting with surfaces at the edges of adjacent pattern features. Measurements of lateral diffusion via analysis of mean square displacements also indicated lateral diffusion coefficients in excellent agreement with rigorous theoretical predictions.Texas A&M UniversityBevan, Michael A.2006-08-16T19:01:50Z2006-08-16T19:01:50Z2005-052006-08-16T19:01:50ZBookThesisElectronic Dissertationtext2663400 byteselectronicapplication/pdfborn digitalhttp://hdl.handle.net/1969.1/3747en_US
collection NDLTD
language en_US
format Others
sources NDLTD
topic Total internal reflection microscopy
diffusing colloidal probes microscopy
TIRM
surface potential
pattern
colloidal force
ensemble analysis
map potential energy landscape
Ornstein-Zernike analysis
spellingShingle Total internal reflection microscopy
diffusing colloidal probes microscopy
TIRM
surface potential
pattern
colloidal force
ensemble analysis
map potential energy landscape
Ornstein-Zernike analysis
Wu, Hung-Jen
Direct measurements of ensemble particle and surface interactions on homogeneous and patterned substrates
description In this dissertation, we describe a novel method that we call Diffusing Colloidal Probe Microscopy (DCPM), which integrates Total Internal Reflection Microscopy (TIRM) and Video Microscopy (VM) methods to monitor three dimensional trajectories in colloidal ensembles levitated above macroscopic surfaces. TIRM and VM are well established optical microscopy techniques for measuring normal and lateral colloidal excursions near macroscopic planar surfaces. The interactions between particle-particle and particle-substrate in colloidal interfacial systems are interpreted by statistical analyses from distributions of colloidal particles; dynamic properties of colloidal assembly are also determined from particle trajectories. Our studies show that DCPM is able to detect many particle-surface interactions simultaneously and provides an ensemble average measurement of particle-surface interactions on a homogeneous surface to allow direct comparison of distributed and average properties. A benefit of ensemble averaging of many particles is the diminished need for time averaging, which can produce orders of magnitude faster measurement times at higher interfacial particle concentrations. The statistical analyses (Ornstein- Zernike and three dimensional Monte Carlo analyses) are used to obtain particle-particle interactions from lateral distribution functions and to understand the role of nonuniformities in interfacial colloidal systems. An inconsistent finding is the observation of an anomalous long range particle-particle attraction and recovery of the expected DLVO particle-wall interactions for all concentrations examined. The possible influence of charge heterogeneity and particle size polydispersity on measured distribution functions is discussed in regard to inconsistent particle-wall and particle-particle potentials. In the final part of this research, the ability of DCPM is demonstrated to map potential energy landscapes on patterned surfaces by monitoring interactions between diffusing colloidal probes with Au pattern features. Absolute separation is obtained from theoretical fits to measured potential energy profiles and direct measurement by sticking silica colloids to Au surfaces via electrophoretic deposition. Initial results indicate that, as colloidal probe and pattern feature dimensions become comparable, measured potential energy profiles suffer some distortion due to the increased probability of probes interacting with surfaces at the edges of adjacent pattern features. Measurements of lateral diffusion via analysis of mean square displacements also indicated lateral diffusion coefficients in excellent agreement with rigorous theoretical predictions.
author2 Bevan, Michael A.
author_facet Bevan, Michael A.
Wu, Hung-Jen
author Wu, Hung-Jen
author_sort Wu, Hung-Jen
title Direct measurements of ensemble particle and surface interactions on homogeneous and patterned substrates
title_short Direct measurements of ensemble particle and surface interactions on homogeneous and patterned substrates
title_full Direct measurements of ensemble particle and surface interactions on homogeneous and patterned substrates
title_fullStr Direct measurements of ensemble particle and surface interactions on homogeneous and patterned substrates
title_full_unstemmed Direct measurements of ensemble particle and surface interactions on homogeneous and patterned substrates
title_sort direct measurements of ensemble particle and surface interactions on homogeneous and patterned substrates
publisher Texas A&M University
publishDate 2006
url http://hdl.handle.net/1969.1/3747
work_keys_str_mv AT wuhungjen directmeasurementsofensembleparticleandsurfaceinteractionsonhomogeneousandpatternedsubstrates
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