Application of coincidence ion mass spectrometry for chemical and structural analysis at the sub-micron scale
Surfaces can be probed with a variant of secondary ion mass spectrometry (SIMS) where the bombardment is with a sequence of single keV projectiles, each resolved in time and space, coupled with the separate record of the secondary ions (SIs) ejected from each projectile impact. The goal of this stud...
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| Format: | Others |
| Language: | en_US |
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Texas A&M University
2005
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| Online Access: | http://hdl.handle.net/1969.1/2530 |