Analysis of radiation induced errors in transistors in memory elements
From the first integrated circuit which has 16-transistor chip built by Heiman and Steven Hofstein in 1962 to the latest 39.54 billion MOSFET’s using 7nm FinFET technology as of 2019 the scaling of transistors is still challenging. The scaling always needs to satisfy the minimal power constraint, mi...
| Main Author: | |
|---|---|
| Format: | Others |
| Published: |
OpenSIUC
2020
|
| Subjects: | |
| Online Access: | https://opensiuc.lib.siu.edu/theses/2791 https://opensiuc.lib.siu.edu/cgi/viewcontent.cgi?article=3805&context=theses |