Accumulator Based Test Set Embedding

In this paper a test set embedding based on accumulator driven by an odd additive constant is presented. The problem is formulated around finding the location of the test pattern in the sequence generated by the accumulator, given a odd constant C and test set T, in terms of linear Diophantine equat...

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Main Author:	Sudireddy, Samara Simha Reddy
Format:	Others
Published:	OpenSIUC 2009
Subjects:	Accumulator-based test pattern generation Built-in Self Test Test Set Embedding
Online Access:	https://opensiuc.lib.siu.edu/theses/18 https://opensiuc.lib.siu.edu/cgi/viewcontent.cgi?article=1025&context=theses

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spelling	ndltd-siu.edu-oai-opensiuc.lib.siu.edu-theses-10252018-12-20T04:27:06Z Accumulator Based Test Set Embedding Sudireddy, Samara Simha Reddy In this paper a test set embedding based on accumulator driven by an odd additive constant is presented. The problem is formulated around finding the location of the test pattern in the sequence generated by the accumulator, given a odd constant C and test set T, in terms of linear Diophantine equation of two variables. We show that the search space for finding the best constant corresponding to the shortest length, is greatly reduced. Experimental results show a significant improvement in run time with practically acceptable test length. 2009-01-01T08:00:00Z text application/pdf https://opensiuc.lib.siu.edu/theses/18 https://opensiuc.lib.siu.edu/cgi/viewcontent.cgi?article=1025&context=theses Theses OpenSIUC Accumulator-based test pattern generation Built-in Self Test Test Set Embedding
collection	NDLTD
format	Others
sources	NDLTD
topic	Accumulator-based test pattern generation Built-in Self Test Test Set Embedding
spellingShingle	Accumulator-based test pattern generation Built-in Self Test Test Set Embedding Sudireddy, Samara Simha Reddy Accumulator Based Test Set Embedding
description	In this paper a test set embedding based on accumulator driven by an odd additive constant is presented. The problem is formulated around finding the location of the test pattern in the sequence generated by the accumulator, given a odd constant C and test set T, in terms of linear Diophantine equation of two variables. We show that the search space for finding the best constant corresponding to the shortest length, is greatly reduced. Experimental results show a significant improvement in run time with practically acceptable test length.
author	Sudireddy, Samara Simha Reddy
author_facet	Sudireddy, Samara Simha Reddy
author_sort	Sudireddy, Samara Simha Reddy
title	Accumulator Based Test Set Embedding
title_short	Accumulator Based Test Set Embedding
title_full	Accumulator Based Test Set Embedding
title_fullStr	Accumulator Based Test Set Embedding
title_full_unstemmed	Accumulator Based Test Set Embedding
title_sort	accumulator based test set embedding
publisher	OpenSIUC
publishDate	2009
url	https://opensiuc.lib.siu.edu/theses/18 https://opensiuc.lib.siu.edu/cgi/viewcontent.cgi?article=1025&context=theses
work_keys_str_mv	AT sudireddysamarasimhareddy accumulatorbasedtestsetembedding
_version_	1718802428542844928

Accumulator Based Test Set Embedding

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