An AFM-SIMS Nano Tomography Acquisition System

An AFM-SIMS Nano Tomography Acquisition System

An instrument, adding the capability to measure 3D volumetric chemical composition, has been constructed by me as a member of the Sánchez Nano Laboratory. The laboratory's in situ atomic force microscope (AFM) and secondary ion mass spectrometry systems (SIMS) are functional and integrated as o...

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Bibliographic Details
Main Author:	Swinford, Richard William
Format:	Others
Published:	PDXScholar 2017
Subjects:	Secondary ion mass spectrometry Atomic force microscopy Microscopes > Design and construction Physics
Online Access:	https://pdxscholar.library.pdx.edu/open_access_etds/3485 https://pdxscholar.library.pdx.edu/cgi/viewcontent.cgi?article=4494&context=open_access_etds

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