Material Characterization of Zinc Oxide in Bulk and Nanowire Form at Terahertz Frequencies

• Main Author: Kernan, Forest Emerson
• Format: Others
• Published: PDXScholar 2012
• Subjects: Zinc oxide > Electric properties; Zinc oxide thin films; Terahertz spectroscopy; Parallel-plate waveguides; Electrical and Electronics; Other Electrical and Computer Engineering
• Online Access: https://pdxscholar.library.pdx.edu/open_access_etds/510; https://pdxscholar.library.pdx.edu/cgi/viewcontent.cgi?article=1509&context=open_access_etds

Many new applications are being proposed and developed for use in the terahertz (THz) frequency region. Similarly, many new materials are being characterized for possible use in this area. Nanostructured forms are of particular interest since they may yield desirable properties, but they remain especially challenging to characterize. This work focuses on the characterization of zinc oxide (ZnO) in bulk and nanowire form. A method for characterizing nanostructures at THz by use of a parallel-plate waveguide (PPWG) is presented. This method is novel in that it is simple, both in theory and practice, and does not require the use of complex measurement techniques such as differential and double modulated terahertz time-domain spectroscopy (THz-TDS). To enable easy evaluation of the quality of the result the maximum deviation in the material response measurement is presented. The dielectric properties of bulk and nanowire ZnO as determined by THz-TDS measurements are reported, and the electrical conductivity extracted from both are presented for comparison. Experimental results are compared to the well established pseudo-harmonic phonon dielectric model. Shortcomings in the pseudo-harmonic phonon model are resolved when coupled with a modified Drude model. This work will enable the determination of THz material properties from nano-scale and very-thin film materials with better reliability and practicality than what has been possible until now.